Poster # P-263 Comparison of Visx WaveScan Aberrometer and Nidek OPD-Scan

Presenter: Kim, David

< Back to titles

> Cover Page, Authors, Institutions

> Purpose/Objective

> Materials/Methods

> Results

> Conclusions

> View additional images/videos



Click on images to enlarge (a new pop-up window will open)

Zernike Pyramid:


Wavefront Analyzers:


Different Technologies. Same Measurements?:


Purpose:






Posters On Demand home page