Abstract # P-263 Comparison of Visx WaveScan Aberrometer and Nidek OPD-Scan

Presenter:
Kim, David, USA

< Back to titles

> Cover Page, Authors, Institutions

> Purpose/Objective

> Materials/Methods

> Results

> Conclusions

> View additional images/videos
Authors:
Kim, David; Narvaez, Julio; Krassin, Jabin; Bahjri, Khaled

Institutions:
Click on images to enlarge (a new pop-up window will open)

Comparison of VISX WaveScan aberrometer with NIDEK OPD-Scan.:



E-mail a friend about this abstract:
Enter email address:   





Posters On Demand home page