Abstract # P-263 Comparison of Visx WaveScan Aberrometer and Nidek OPD-Scan

Presenter:
Kim, David, USA

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Authors:
Kim, David; Narvaez, Julio; Krassin, Jabin; Bahjri, Khaled

Institutions:
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Comparison of VISX WaveScan aberrometer with NIDEK OPD-Scan.:



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